Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair.
We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may...
| Main Authors: | , , |
|---|---|
| Format: | Journal article |
| Jezik: | English |
| Izdano: |
2013
|