APA ציטוט

Kirkland, A., & Meyer, R. (2004). "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.

Chicago Style (17th ed.) Citation

Kirkland, A., and R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.

ציטוט MLA

Kirkland, A., and R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.