Kirkland, A., & Meyer, R. (2004). "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.
Citazione stile Chigago Style (17a edizione)Kirkland, A., e R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
Citatione MLA (9a ed.)Kirkland, A., e R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.