Kirkland, A., & Meyer, R. (2004). "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.
Chicago (17e ed.) BronvermeldingKirkland, A., en R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
MLA (9e ed.) BronvermeldingKirkland, A., en R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
Let op: Deze citaties zijn niet altijd 100% accuraat.