Citação norma APA

Kirkland, A., & Meyer, R. (2004). "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.

Citação norma Chicago

Kirkland, A., and R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.

Citação norma MLA

Kirkland, A., and R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.

Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.