Kirkland, A., & Meyer, R. (2004). "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.
Citação do estilo Chicago (17ª ed.)Kirkland, A., e R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
Citação MLA (9ª ed.)Kirkland, A., e R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.