Kirkland, A., & Meyer, R. (2004). "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.
Цитирование в стиле Чикаго (17-е изд.)Kirkland, A., и R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
Цитирование MLA (9-е изд.)Kirkland, A., и R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.