Kirkland, A., & Meyer, R. (2004). "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.
芝加哥风格引文Kirkland, A., 与 R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
MLA引文Kirkland, A., 与 R. Meyer. "Indirect" High-resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction. 2004.
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