"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

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Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave funct...

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Dades bibliogràfiques
Autors principals:	Kirkland, A, Meyer, R
Format:	Journal article
Idioma:	English
Publicat:	2004

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