"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave funct...
| Հիմնական հեղինակներ: | , |
|---|---|
| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
2004
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