"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

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Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave funct...

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Chi tiết về thư mục
Những tác giả chính:	Kirkland, A, Meyer, R
Định dạng:	Journal article
Ngôn ngữ:	English
Được phát hành:	2004

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