"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

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Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave funct...

書目詳細資料
Main Authors:	Kirkland, A, Meyer, R
格式:	Journal article
語言:	English
出版:	2004

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