"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave funct...
| Автори: | , |
|---|---|
| Формат: | Journal article |
| Мова: | English |
| Опубліковано: |
2004
|