Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector
Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive mat...
| Main Authors: | , , , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Springer Nature
2019
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| _version_ | 1826261451681038336 |
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| author | Song, J Allen, C Gao, S Huang, C Sawada, H Pan, X Warner, J Wang, P Kirkland, A |
| author_facet | Song, J Allen, C Gao, S Huang, C Sawada, H Pan, X Warner, J Wang, P Kirkland, A |
| author_sort | Song, J |
| collection | OXFORD |
| description | Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive materials. Here we report defocused electron ptychography using a fast, direct-counting detector to reconstruct the transmission function, which is in turn related to the electrostatic potential of a two-dimensional material at atomic resolution under various low dose conditions. |
| first_indexed | 2024-03-06T19:21:39Z |
| format | Journal article |
| id | oxford-uuid:1a4ea21a-ab5c-4389-aafe-1fd7594e38be |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-06T19:21:39Z |
| publishDate | 2019 |
| publisher | Springer Nature |
| record_format | dspace |
| spelling | oxford-uuid:1a4ea21a-ab5c-4389-aafe-1fd7594e38be2022-03-26T10:54:01ZAtomic resolution defocused electron ptychography at low dose with a fast, direct electron detectorJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:1a4ea21a-ab5c-4389-aafe-1fd7594e38beEnglishSymplectic Elements at OxfordSpringer Nature2019Song, JAllen, CGao, SHuang, CSawada, HPan, XWarner, JWang, PKirkland, AElectron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive materials. Here we report defocused electron ptychography using a fast, direct-counting detector to reconstruct the transmission function, which is in turn related to the electrostatic potential of a two-dimensional material at atomic resolution under various low dose conditions. |
| spellingShingle | Song, J Allen, C Gao, S Huang, C Sawada, H Pan, X Warner, J Wang, P Kirkland, A Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector |
| title | Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector |
| title_full | Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector |
| title_fullStr | Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector |
| title_full_unstemmed | Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector |
| title_short | Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector |
| title_sort | atomic resolution defocused electron ptychography at low dose with a fast direct electron detector |
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