Carrier dynamics in ion-implanted GaAs studied by simulation and observation of terahertz emission
We have studied terahertz (THz) emission from arsenic-ion implanted GaAs both experimentally and using a three-dimensional carrier dynamics simulation. A uniform density of vacancies was formed over the optical absorption depth of bulk GaAs samples by performing multienergy implantations of arsenic...
Main Authors: | Lloyd-Hughes, J, Castro-Camus, E, Fraser, MD, Jagadish, C, Johnston, M |
---|---|
Format: | Journal article |
Language: | English |
Published: |
2004
|
Similar Items
-
Carrier dynamics in ion-implanted GaAs studied by simulation and observation of terahertz emission
by: Lloyd-Hughes, J, et al.
Published: (2004) -
Carrier dynamics in ion-implanted semiconductors studied by simulation and observation of terahertz emission - art. no. 61180K
by: Lloyd-Hughes, J, et al.
Published: (2006) -
Influence of surface passivation on ultrafast carrier dynamics and terahertz radiation generation in GaAs
by: Lloyd-Hughes, J, et al.
Published: (2006) -
Terahertz emission and lifetime measurements of ion-implanted semiconductors: Experiment and simulation
by: Lloyd-Hughes, J, et al.
Published: (2006) -
Transient terahertz conductivity of GaAs nanowires
by: Parkinson, P, et al.
Published: (2007)