Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University

Applications relevant to carbon based nano-materials have been explored using a newly installed JEOL-2200FS field emission gun (FEG) (scanning) transmission electron microscope (S)TEM which is integrated with two CEOS aberration correctors for both the TEM image-forming and the STEM probe-forming le...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид: Jiang, H, Ruokolainen, J, Young, N, Oikawa, T, Nasibulin, A, Kirkland, A, Kauppinen, E
Формат: Journal article
Хэл сонгох:English
Хэвлэсэн: 2012

Ижил төстэй зүйлс