Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University
Applications relevant to carbon based nano-materials have been explored using a newly installed JEOL-2200FS field emission gun (FEG) (scanning) transmission electron microscope (S)TEM which is integrated with two CEOS aberration correctors for both the TEM image-forming and the STEM probe-forming le...
Үндсэн зохиолчид: | Jiang, H, Ruokolainen, J, Young, N, Oikawa, T, Nasibulin, A, Kirkland, A, Kauppinen, E |
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Формат: | Journal article |
Хэл сонгох: | English |
Хэвлэсэн: |
2012
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