Properties of Tl2Ba2CaCu2O8 thin film intrinsic Josephson junctions in an in-plane magnetic field
We have performed transport measurements on intrinsic Josephson junctions in misaligned thin films of Tl2Ba2CaCu2O8. This has been done in both zero field and in-plane aligned magnetic fields of up to 5 T. We have compared wet-etched and ion-milled devices and find that the more precise structure pr...
| Main Authors: | , , , , , , , , |
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| Format: | Conference item |
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2001
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| Summary: | We have performed transport measurements on intrinsic Josephson junctions in misaligned thin films of Tl2Ba2CaCu2O8. This has been done in both zero field and in-plane aligned magnetic fields of up to 5 T. We have compared wet-etched and ion-milled devices and find that the more precise structure produced by ion-milling gives superior results. In the case of ion-milled devices we are able to individually switch on up to 50 junctions. For an n-plane field of 3 T there is complete suppression of the critical current. We have seen displaced branches for in-plane fields above 1.5 T. This branching is due to Josephson flux flow. For in-plane fields greater than 2 T the relationship between the maximum flux-flow voltage and the applied field is linear. (C) 2001 Elsevier Science B.V. All rights reserved. |
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