High angle dark field STEM for advanced materials

Podobne zapisy

• Microanalysis at the atomic level
  od: Pennycook, S, i wsp.
  Wydane: (1995)
• Subangstrom resolution imaging using annular dark-field STEM
  od: Nellist, P, i wsp.
  Wydane: (1999)
• The principles and interpretation of annular dark-field Z-contrast imaging
  od: Nellist, P, i wsp.
  Wydane: (2000)
• Towards quantitative analysis of core-shell catalyst nanoparticles by aberration corrected high angle annular dark field STEM and EDX
  od: E, H, i wsp.
  Wydane: (2010)
• Towards quantitative analysis of core-shell catalyst nano-particles by aberration corrected high angle annular dark field STEM and EDX
  od: E, H, i wsp.
  Wydane: (2010)