Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
MICROSTRUCTURAL OBSERVATIONS O...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
MICROSTRUCTURAL OBSERVATIONS OF TA/AL SUPERLATTICES BY TEM
Bibliographic Details
Main Authors:
Jiang, S
,
Zou, J
,
Cockayne, D
,
Sikorski, A
,
Hu, A
,
Peng, R
Format:
Journal article
Published:
1992
Holdings
Description
Similar Items
Staff View
Similar Items
AN ELECTRON-DIFFRACTION AND MICROSCOPY INVESTIGATION OF QUASI-PERIODIC TA-AL SUPERLATTICES
by: Jiang, S, et al.
Published: (1992)
Diffraction behaviour of three-component Fibonacci Ta/Al multilayer films
by: Jiang, S, et al.
Published: (1997)
TEM study of compositional profile in AlGaAs/GaAs quantum wells
by: Zou, J, et al.
Published: (1998)
TEM study of intermetallic phases in 55Al-Zn coatings
by: Zou, J, et al.
Published: (1998)
TEM studies of misfit dislocations in strained-layer heterostructures
by: Zou, J, et al.
Published: (1994)