Kirkland, A., Nellist, P., Chang, L., & Haigh, S. (2008). Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy.
Citazione stile Chigago Style (17a edizione)Kirkland, A., P. Nellist, L. Chang, e S. Haigh. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Citatione MLA (9a ed.)Kirkland, A., et al. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.