Cita APA (7th ed.)

Kirkland, A., Nellist, P., Chang, L., & Haigh, S. (2008). Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy.

Cita Chicago (17th ed.)

Kirkland, A., P. Nellist, L. Chang, i S. Haigh. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.

Cita MLA (9th ed.)

Kirkland, A., et al. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.

Atenció: Aquestes cites poden no estar 100% correctes.