Kirkland, A., Nellist, P., Chang, L., & Haigh, S. (2008). Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy.
Chicago-Zitierstil (17. Ausg.)Kirkland, A., P. Nellist, L. Chang, und S. Haigh. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
MLA-Zitierstil (9. Ausg.)Kirkland, A., et al. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.