Kirkland, A., Nellist, P., Chang, L., & Haigh, S. (2008). Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy.
Lua i Stíl Chicago (17ú heag.)Kirkland, A., P. Nellist, L. Chang, agus S. Haigh. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Lua MLA (9ú heag.)Kirkland, A., et al. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.