Kirkland, A., Nellist, P., Chang, L., & Haigh, S. (2008). Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy.
Chicago (17e ed.) BronvermeldingKirkland, A., P. Nellist, L. Chang, en S. Haigh. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
MLA (9e ed.) BronvermeldingKirkland, A., et al. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Let op: Deze citaties zijn niet altijd 100% accuraat.