APA (7e ed.) Bronvermelding

Kirkland, A., Nellist, P., Chang, L., & Haigh, S. (2008). Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy.

Chicago (17e ed.) Bronvermelding

Kirkland, A., P. Nellist, L. Chang, en S. Haigh. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.

MLA (9e ed.) Bronvermelding

Kirkland, A., et al. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.

Let op: Deze citaties zijn niet altijd 100% accuraat.