Kirkland, A., Nellist, P., Chang, L., & Haigh, S. (2008). Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy.
Цитирование в стиле Чикаго (17-е изд.)Kirkland, A., P. Nellist, L. Chang, и S. Haigh. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Цитирование MLA (9-е изд.)Kirkland, A., et al. Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy. 2008.
Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.