Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Podrobná bibliografie
Hlavní autoři:	Kirkland, A, Nellist, P, Chang, L, Haigh, S
Médium:	Journal article
Vydáno:	2008

Podobné jednotky

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Autor: Kirkland, A, a další
Vydáno: (2008)

Progress in aberration-corrected scanning transmission electron microscopy.
Autor: Dellby, N, a další
Vydáno: (2001)

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
Autor: Nellist, P, a další
Vydáno: (2008)

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
Autor: Cosgriff, E, a další
Vydáno: (2008)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
Autor: Nellist, P, a další
Vydáno: (2008)

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
Autor: Wang, P, a další
Vydáno: (2009)

Transmission electron microscopy without aberrations: Applications to materials science
Autor: Kirkland, A, a další
Vydáno: (2008)

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
Autor: Cosgriff, E, a další
Vydáno: (2010)

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
Autor: Wang, P, a další
Vydáno: (2010)

Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
Autor: Wang, P, a další
Vydáno: (2010)

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
Autor: Wang, P, a další
Vydáno: (2011)

Scanning transmission electron microscopy : imaging and analysis /
Autor: Pennycook, Stephen J., a další
Vydáno: (2011)

New possibilities with aberration-corrected electron microscopy.
Autor: Cockayne, D, a další
Vydáno: (2009)

Z-contrast scanning transmission electron microscopy
Autor: Pennycook, S, a další
Vydáno: (1999)

Image formation mechanisms in three-dimensional aberration-corrected scanning transmission electron microscopy
Autor: Cosgriff, EC
Vydáno: (2008)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
Autor: Behan, G, a další
Vydáno: (2009)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
Autor: Cosgriff, E, a další
Vydáno: (2008)

High-resolution imaging of zeolite with aberration-corrected transmission electron microscopy
Autor: Kaname Yoshida, a další
Vydáno: (2013-04-01)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
Autor: D'Alfonso, A, a další
Vydáno: (2008)

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
Autor: Pennycook, S, a další
Vydáno: (2000)

Atomic-scale imaging of electron sensitive zeolites with aberration corrected transmission electron microscopy
Autor: Kaname Yoshida, a další
Vydáno: (2023-12-01)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
Autor: Nellist, P, a další
Vydáno: (2008)

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
Autor: Kirkland, A, a další
Vydáno: (2004)

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
Autor: Kirkland, A, a další
Vydáno: (2004)

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
Autor: Kirkland, A, a další
Vydáno: (2004)

Scanning and transmission electron microscopy : an introduction /
Autor: Flegler, Stanley L., a další
Vydáno: ([199)

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
Autor: Hashimoto, A, a další
Vydáno: (2012)

Correlative transmission electron microscopy and scanning electron microscopy of rabbit cornea.
Autor: Othman, Fauziah, a další
Vydáno: (2010)

Aberration-corrected transmission electron microscopy of a non-graphitizing carbon
Autor: Allen, CS, a další
Vydáno: (2022)

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
Autor: Behan, G, a další
Vydáno: (2008)

The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy
Autor: Browning, ND, a další
Vydáno: (2023)

Atomic-level handedness determination of chiral crystals using aberration-corrected scanning transmission electron microscopy
Autor: Zhuoya Dong, a další
Vydáno: (2020-03-01)

Materials advances through aberration-corrected electron microscopy
Autor: Pennycook, S, a další
Vydáno: (2006)

Materials advances through aberration-corrected electron microscopy
Autor: Pennycook, S, a další
Vydáno: (2006)

Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration.
Autor: Haigh, S, a další
Vydáno: (2010)

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
Autor: Ciston, J, a další
Vydáno: (2009)

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.
Autor: Jones, L, a další
Vydáno: (2014)

Transmission electron microscopy: Overview and challenges
Autor: Pennycook, S, a další
Vydáno: (2003)

Dynamical scattering in ice-embedded proteins in conventional and scanning transmission electron microscopy
Autor: Max Leo Leidl, a další
Vydáno: (2023-07-01)

Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
Autor: Nicolosi, V, a další
Vydáno: (2010)