Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

ग्रंथसूची विवरण
मुख्य लेखकों:	Kirkland, A, Nellist, P, Chang, L, Haigh, S
स्वरूप:	Journal article
प्रकाशित:	2008

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
द्वारा: Kirkland, A, और अन्य
प्रकाशित: (2008)

Progress in aberration-corrected scanning transmission electron microscopy.
द्वारा: Dellby, N, और अन्य
प्रकाशित: (2001)

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
द्वारा: Nellist, P, और अन्य
प्रकाशित: (2008)

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
द्वारा: Cosgriff, E, और अन्य
प्रकाशित: (2008)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
द्वारा: Nellist, P, और अन्य
प्रकाशित: (2008)

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
द्वारा: Wang, P, और अन्य
प्रकाशित: (2009)

Transmission electron microscopy without aberrations: Applications to materials science
द्वारा: Kirkland, A, और अन्य
प्रकाशित: (2008)

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
द्वारा: Cosgriff, E, और अन्य
प्रकाशित: (2010)

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
द्वारा: Wang, P, और अन्य
प्रकाशित: (2010)

Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
द्वारा: Wang, P, और अन्य
प्रकाशित: (2010)

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
द्वारा: Wang, P, और अन्य
प्रकाशित: (2011)

Scanning transmission electron microscopy : imaging and analysis /
द्वारा: Pennycook, Stephen J., और अन्य
प्रकाशित: (2011)

New possibilities with aberration-corrected electron microscopy.
द्वारा: Cockayne, D, और अन्य
प्रकाशित: (2009)

Z-contrast scanning transmission electron microscopy
द्वारा: Pennycook, S, और अन्य
प्रकाशित: (1999)

Image formation mechanisms in three-dimensional aberration-corrected scanning transmission electron microscopy
द्वारा: Cosgriff, EC
प्रकाशित: (2008)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
द्वारा: Behan, G, और अन्य
प्रकाशित: (2009)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
द्वारा: Cosgriff, E, और अन्य
प्रकाशित: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
द्वारा: D'Alfonso, A, और अन्य
प्रकाशित: (2008)

High-resolution imaging of zeolite with aberration-corrected transmission electron microscopy
द्वारा: Kaname Yoshida, और अन्य
प्रकाशित: (2013-04-01)

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
द्वारा: Pennycook, S, और अन्य
प्रकाशित: (2000)

Atomic-scale imaging of electron sensitive zeolites with aberration corrected transmission electron microscopy
द्वारा: Kaname Yoshida, और अन्य
प्रकाशित: (2023-12-01)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
द्वारा: Nellist, P, और अन्य
प्रकाशित: (2008)

Aberration correction for low voltage optimized transmission electron microscopy
द्वारा: Jaromír Bačovský
प्रकाशित: (2018-01-01)

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
द्वारा: Kirkland, A, और अन्य
प्रकाशित: (2004)

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
द्वारा: Kirkland, A, और अन्य
प्रकाशित: (2004)

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
द्वारा: Kirkland, A, और अन्य
प्रकाशित: (2004)

Scanning and transmission electron microscopy : an introduction /
द्वारा: Flegler, Stanley L., और अन्य
प्रकाशित: ([199)

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
द्वारा: Hashimoto, A, और अन्य
प्रकाशित: (2012)

Correlative transmission electron microscopy and scanning electron microscopy of rabbit cornea.
द्वारा: Othman, Fauziah, और अन्य
प्रकाशित: (2010)

Aberration-corrected transmission electron microscopy of a non-graphitizing carbon
द्वारा: Allen, CS, और अन्य
प्रकाशित: (2022)

The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy
द्वारा: Browning, ND, और अन्य
प्रकाशित: (2023)

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
द्वारा: Behan, G, और अन्य
प्रकाशित: (2008)

Atomic-level handedness determination of chiral crystals using aberration-corrected scanning transmission electron microscopy
द्वारा: Zhuoya Dong, और अन्य
प्रकाशित: (2020-03-01)

Materials advances through aberration-corrected electron microscopy
द्वारा: Pennycook, S, और अन्य
प्रकाशित: (2006)

Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration.
द्वारा: Haigh, S, और अन्य
प्रकाशित: (2010)

Transmission and scanning electron microscopy of cutis rhomboidalis
द्वारा: Ângela Faistauer Torre, और अन्य
प्रकाशित: (2021-07-01)

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
द्वारा: Ciston, J, और अन्य
प्रकाशित: (2009)

Robotic fabrication of high-quality lamellae for aberration-corrected transmission electron microscopy
द्वारा: Hideyo Tsurusawa, और अन्य
प्रकाशित: (2021-11-01)

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.
द्वारा: Jones, L, और अन्य
प्रकाशित: (2014)

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

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