Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Opis bibliograficzny
Główni autorzy:	Kirkland, A, Nellist, P, Chang, L, Haigh, S
Format:	Journal article
Wydane:	2008

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