Joan edukira
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Hizkuntza
Eremu guztiak
Izenburua
Egilea
Gaia
Sailkapena
ISBN/ISSN
Etiketa
Bilatu
Aurreratua
Aberration-Corrected Imaging i...
Erreferentzia bihurtu
SMS
Bidali
Imprimir
Erregistroa esportatu
Nora RefWorks
Nora EndNoteWeb
Nora EndNote
Permanent link
Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Xehetasun bibliografikoak
Egile Nagusiak:
Kirkland, A
,
Nellist, P
,
Chang, L
,
Haigh, S
Formatua:
Journal article
Argitaratua:
2008
Aleari buruzko argibideak
Deskribapena
Antzeko izenburuak
MARC erregistroa
Antzeko izenburuak
Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
nork: Kirkland, A, et al.
Argitaratua: (2008)
Progress in aberration-corrected scanning transmission electron microscopy.
nork: Dellby, N, et al.
Argitaratua: (2001)
Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
nork: Nellist, P, et al.
Argitaratua: (2008)
Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
nork: Cosgriff, E, et al.
Argitaratua: (2008)
Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
nork: Nellist, P, et al.
Argitaratua: (2008)