Hard x-ray photoelectron spectroscopy as a probe of the intrinsic electronic properties of CdO

Hard x-ray photoelectron spectroscopy as a probe of the intrinsic electronic properties of CdO

Hard x-ray photoelectron spectroscopy (HAXPES) is used to investigate the intrinsic electronic properties of single crystal epitaxial CdO(100) thin films grown by metal organic vapor phase epitaxy (MOVPE). The reduced surface sensitivity of the HAXPES technique relaxes stringent surface preparation...

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Bibliographic Details
Main Authors:	Mudd, J, Lee, T, Munoz-Sanjose, V, Zuniga-Perez, J, Hesp, D, Kahk, J, Payne, D, Egdell, R, McConville, C
Format:	Journal article
Published:	2014

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