Optically detected cyclotron resonance of GaAs-based semiconductors

<p>Cyclotron resonance has been measured in GaAs and related compounds through the use of a new experimental technique developed for the study of very pure semiconductors called optically detected cyclotron resonance (ODCR).</p> <p>ODCR differs from other forms of magnetospectrosc...

Täydet tiedot

Bibliografiset tiedot
Päätekijät: Michels, J, Joe G. Michels
Muut tekijät: Nicholas, R
Aineistotyyppi: Opinnäyte
Kieli:English
Julkaistu: 1994
Aiheet: