Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
A UK Facility for Atom Probe T...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
A UK Facility for Atom Probe Tomography Analysis
Bibliographic Details
Main Authors:
Marquis, E
,
Saxey, D
,
Cerezo, A
,
Smith, G
Format:
Journal article
Published:
2009
Holdings
Description
Similar Items
Staff View
Description
Summary:
Similar Items
Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
by: Muller, M, et al.
Published: (2010)
Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
by: Müller, M, et al.
Published: (2010)
Atom probe characterization of precipitation in an aged Cu-Ni-P alloy.
by: Aruga, Y, et al.
Published: (2011)
Nanoscale characterisation of ODS-Eurofer 97 steel: An atom-probe tomography study
by: Williams, C, et al.
Published: (2010)
Atom probe tomography today
by: Cerezo, A, et al.
Published: (2007)