Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells

Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells

Dades bibliogràfiques
Autors principals:	Bennett, SE, Saxey, D, Kappers, M, Barnard, J, Humphreys, C, Smith, G, Oliver, R
Format:	Journal article
Publicat:	2011

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