Korsunsky, A., Zhang, S., Dini, D., Vorster, W., & Liu, J. (2006). Oxford HEXameter: Laboratory high energy X-ray diffractometer for bulk residual stress analysis. Trans Tech Publications.
Cita Chicago (17th ed.)Korsunsky, A., S. Zhang, D. Dini, W. Vorster, i J. Liu. Oxford HEXameter: Laboratory High Energy X-ray Diffractometer for Bulk Residual Stress Analysis. Trans Tech Publications, 2006.
Cita MLA (9th ed.)Korsunsky, A., et al. Oxford HEXameter: Laboratory High Energy X-ray Diffractometer for Bulk Residual Stress Analysis. Trans Tech Publications, 2006.
Atenció: Aquestes cites poden no estar 100% correctes.