Korsunsky, A., Zhang, S., Dini, D., Vorster, W., & Liu, J. (2006). Oxford HEXameter: Laboratory high energy X-ray diffractometer for bulk residual stress analysis. Trans Tech Publications.
Citación estilo ChicagoKorsunsky, A., S. Zhang, D. Dini, W. Vorster, and J. Liu. Oxford HEXameter: Laboratory High Energy X-ray Diffractometer for Bulk Residual Stress Analysis. Trans Tech Publications, 2006.
Cita MLAKorsunsky, A., et al. Oxford HEXameter: Laboratory High Energy X-ray Diffractometer for Bulk Residual Stress Analysis. Trans Tech Publications, 2006.
Warning: These citations may not always be 100% accurate.