Korsunsky, A., Zhang, S., Dini, D., Vorster, W., & Liu, J. (2006). Oxford HEXameter: Laboratory high energy X-ray diffractometer for bulk residual stress analysis. Trans Tech Publications.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रKorsunsky, A., S. Zhang, D. Dini, W. Vorster, और J. Liu. Oxford HEXameter: Laboratory High Energy X-ray Diffractometer for Bulk Residual Stress Analysis. Trans Tech Publications, 2006.
एमएलए (9वां संस्करण) प्रशस्ति पत्रKorsunsky, A., et al. Oxford HEXameter: Laboratory High Energy X-ray Diffractometer for Bulk Residual Stress Analysis. Trans Tech Publications, 2006.
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