Anodisation of gridded silicon field emitter arrays

Field emission characterisation of gridded silicon FEAs was carried out before and after anodisation. Each sample contains ten gridded FEAs with array sizes varying from I to 10x10. For each sample, both current-voltage and current-time measurements of each FEA were carried out before and after arzo...

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Main Authors: Huang, M, Huq, SE, Prewett, P, Smith, G, Wilshaw, P, Korea, E
Format: Conference item
Published: IEEE 1997
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author Huang, M
Huq, SE
Prewett, P
Smith, G
Wilshaw, P
Korea, E
author_facet Huang, M
Huq, SE
Prewett, P
Smith, G
Wilshaw, P
Korea, E
author_sort Huang, M
collection OXFORD
description Field emission characterisation of gridded silicon FEAs was carried out before and after anodisation. Each sample contains ten gridded FEAs with array sizes varying from I to 10x10. For each sample, both current-voltage and current-time measurements of each FEA were carried out before and after arzodisation. The morphology and thickness of the porous silicon layer on the emitters were controlled by the anodising current density and duration of the anodisation process. The emission uniformity of FEAs was evaluated by comparing the I-V curves from different FEAs, which show that the emission uniformity had been improved after anodisation. In addition, the I-t measurements show that the emission stability of FEAs is very sensitive to anodisation time, and it is essential to use a very short anodisation time (similar to 0.1 second) to obtain stable emission currents. Under these conditions no adverse effects of the anodisation process on emission stability have been found whilst the improvements in operating voltage and uniformity are maintained.
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spelling oxford-uuid:2a16dc79-4e2e-4012-bcd6-e446c68dbddb2022-03-26T12:22:58ZAnodisation of gridded silicon field emitter arraysConference itemhttp://purl.org/coar/resource_type/c_5794uuid:2a16dc79-4e2e-4012-bcd6-e446c68dbddbSymplectic Elements at OxfordIEEE1997Huang, MHuq, SEPrewett, PSmith, GWilshaw, PKorea, EField emission characterisation of gridded silicon FEAs was carried out before and after anodisation. Each sample contains ten gridded FEAs with array sizes varying from I to 10x10. For each sample, both current-voltage and current-time measurements of each FEA were carried out before and after arzodisation. The morphology and thickness of the porous silicon layer on the emitters were controlled by the anodising current density and duration of the anodisation process. The emission uniformity of FEAs was evaluated by comparing the I-V curves from different FEAs, which show that the emission uniformity had been improved after anodisation. In addition, the I-t measurements show that the emission stability of FEAs is very sensitive to anodisation time, and it is essential to use a very short anodisation time (similar to 0.1 second) to obtain stable emission currents. Under these conditions no adverse effects of the anodisation process on emission stability have been found whilst the improvements in operating voltage and uniformity are maintained.
spellingShingle Huang, M
Huq, SE
Prewett, P
Smith, G
Wilshaw, P
Korea, E
Anodisation of gridded silicon field emitter arrays
title Anodisation of gridded silicon field emitter arrays
title_full Anodisation of gridded silicon field emitter arrays
title_fullStr Anodisation of gridded silicon field emitter arrays
title_full_unstemmed Anodisation of gridded silicon field emitter arrays
title_short Anodisation of gridded silicon field emitter arrays
title_sort anodisation of gridded silicon field emitter arrays
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AT prewettp anodisationofgriddedsiliconfieldemitterarrays
AT smithg anodisationofgriddedsiliconfieldemitterarrays
AT wilshawp anodisationofgriddedsiliconfieldemitterarrays
AT koreae anodisationofgriddedsiliconfieldemitterarrays