Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography

The impact of laser pulsing on the field evaporation process is investigated for Al and W by pulsed laser atom probe tomography. Quantitative analysis reveals the influence on the spatial resolution of the peak temperature reached by the specimen following light absorption from the laser pulse. It i...

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Main Authors: Gault, B, Mueller, M, La Fontaine, A, Moody, M, Shariq, A, Cerezo, A, Ringer, S, Smith, G
Formato: Journal article
Idioma:English
Publicado em: 2010
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author Gault, B
Mueller, M
La Fontaine, A
Moody, M
Shariq, A
Cerezo, A
Ringer, S
Smith, G
author_facet Gault, B
Mueller, M
La Fontaine, A
Moody, M
Shariq, A
Cerezo, A
Ringer, S
Smith, G
author_sort Gault, B
collection OXFORD
description The impact of laser pulsing on the field evaporation process is investigated for Al and W by pulsed laser atom probe tomography. Quantitative analysis reveals the influence on the spatial resolution of the peak temperature reached by the specimen following light absorption from the laser pulse. It is concluded that surface migration processes induce significant degradation of the lateral resolution, changing by 100% and 20%, respectively, for Al and W when the specimen temperature is increased from 4% to 7% of the material's melting point, while the in-depth resolution is shown to remain nearly constant for both materials. © 2010 American Institute of Physics.
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spelling oxford-uuid:2a877758-18d8-4573-8e5d-15008732f63a2022-03-26T12:25:34ZInfluence of surface migration on the spatial resolution of pulsed laser atom probe tomographyJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:2a877758-18d8-4573-8e5d-15008732f63aEnglishSymplectic Elements at Oxford2010Gault, BMueller, MLa Fontaine, AMoody, MShariq, ACerezo, ARinger, SSmith, GThe impact of laser pulsing on the field evaporation process is investigated for Al and W by pulsed laser atom probe tomography. Quantitative analysis reveals the influence on the spatial resolution of the peak temperature reached by the specimen following light absorption from the laser pulse. It is concluded that surface migration processes induce significant degradation of the lateral resolution, changing by 100% and 20%, respectively, for Al and W when the specimen temperature is increased from 4% to 7% of the material's melting point, while the in-depth resolution is shown to remain nearly constant for both materials. © 2010 American Institute of Physics.
spellingShingle Gault, B
Mueller, M
La Fontaine, A
Moody, M
Shariq, A
Cerezo, A
Ringer, S
Smith, G
Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
title Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
title_full Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
title_fullStr Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
title_full_unstemmed Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
title_short Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
title_sort influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
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