CALCULATION AND INTERPRETATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF LATTICE-DEFECTS

פריטים דומים

• Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis.
  מאת: Anstis, G, et al.
  יצא לאור: (2003)
• STUDY OF RELATIONSHIP BETWEEN LATTICE FRINGES AND LATTICE PLANES IN ELECTRON MICROSCOPE IMAGES OF CRYSTALS CONTAINING DEFECTS
  מאת: Cockayne, D, et al.
  יצא לאור: (1971)
• POTENTIALITIES AND LIMITATIONS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CRYSTAL LATTICES AND THEIR IMPERFECTIONS
  מאת: Cockayne, D
  יצא לאור: (1975)
• An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
  מאת: Anderson, S, et al.
  יצא לאור: (1997)
• INTERPRETATION OF LATTICE FRINGE IMAGES OF SPINODALLY DECOMPOSED ALLOYS
  מאת: Cockayne, D, et al.
  יצא לאור: (1980)