The role of interface quality in resonant tunneling between transverse X-states in GaAs/AlAs double barrier structures pressurised beyond the type II transition

We examine in detail the first high pressure resonance related to tunneling between the lowest transverse X-state in each AlAs layer, of GaAs/AlAs 'double barrier' structures with equal AlAs thicknesses grown by Molecular Beam Epitaxy (MBE) calibrated using Reflection High Energy Electron...

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Príomhchruthaitheoirí: Smith, J, Klipstein, P, Austing, D, Grey, R, Hill, G
Formáid: Journal article
Teanga:English
Foilsithe / Cruthaithe: 1995