Variability in long-duration operation of silicon tip field emission devices
Development of reliable field emission devices requires detailed characterization of variability over the device lifetime. Silicon tip manufacturing processes and test equipment limitations are theoretically predicted to cause ∼5% variability in field emission currents. Long-duration emission curren...
| Main Authors: | , , , , , |
|---|---|
| 格式: | Journal article |
| 语言: | English |
| 出版: |
2006
|