DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY

Παρόμοια τεκμήρια

• WEAK-BEAM ELECTRON-MICROSCOPY
  ανά: Cockayne, D
  Έκδοση: (1981)
• Applications of the weak beam technique of electron microscopy
  ανά: Cockayne, D
  Έκδοση: (1999)
• THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
  ανά: Cockayne, D
  Έκδοση: (1972)
• PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
  ανά: Cockayne, D
  Έκδοση: (1973)
• INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS
  ανά: Cockayne, D, κ.ά.
  Έκδοση: (1969)