DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY

Ítems similars

• WEAK-BEAM ELECTRON-MICROSCOPY
  per: Cockayne, D
  Publicat: (1981)
• Applications of the weak beam technique of electron microscopy
  per: Cockayne, D
  Publicat: (1999)
• THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
  per: Cockayne, D
  Publicat: (1972)
• PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
  per: Cockayne, D
  Publicat: (1973)
• INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS
  per: Cockayne, D, et al.
  Publicat: (1969)