Low-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3

The luminescence properties of Ti-doped Al2O3 crystals have been studied using monochromatic VUV and X-ray radiation in the temperature range 9-300 K. In addition to the emission band of Ti3+ in the near IR region and blue emission at 420 nm that are commonly observed in this material, we detected a...

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Main Authors: MIkhailik, V, Kraus, H, Balcerzyk, M, Czarnacki, W, Moszynski, M, Mykhaylyk, MS, Wahl, D
Format: Journal article
Language:English
Published: 2005
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author MIkhailik, V
Kraus, H
Balcerzyk, M
Czarnacki, W
Moszynski, M
Mykhaylyk, MS
Wahl, D
author_facet MIkhailik, V
Kraus, H
Balcerzyk, M
Czarnacki, W
Moszynski, M
Mykhaylyk, MS
Wahl, D
author_sort MIkhailik, V
collection OXFORD
description The luminescence properties of Ti-doped Al2O3 crystals have been studied using monochromatic VUV and X-ray radiation in the temperature range 9-300 K. In addition to the emission band of Ti3+ in the near IR region and blue emission at 420 nm that are commonly observed in this material, we detected a UV band at 290 nm which contributes approximately one-third to the integrated emission under X-ray excitation. Based on the results of the study this band was assigned to the radiative decay of excitons localised at activator ions. Particular attention has been given to the assessment of the feasibility of the material as cryogenic scintillation detector. The low-temperature scintillation light yield of Al2O 3-Ti (0.20 wt%) is found to be 2300±200 ph/MeV at 32 keV and an estimate shows that it is two times larger for a sample with 0.07 wt% of activator. Given this, we concluded that Ti-doped Al2O3 appears to be very suitable material for cryogenic Dark Matter search experiments that rely on the simultaneous detection of phonon and scintillation signals. © 2005 Elsevier B.V. All rights reserved.
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spelling oxford-uuid:2f3c5e86-1fd7-44fb-9d96-2d78278691582022-03-26T12:54:06ZLow-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:2f3c5e86-1fd7-44fb-9d96-2d7827869158EnglishSymplectic Elements at Oxford2005MIkhailik, VKraus, HBalcerzyk, MCzarnacki, WMoszynski, MMykhaylyk, MSWahl, DThe luminescence properties of Ti-doped Al2O3 crystals have been studied using monochromatic VUV and X-ray radiation in the temperature range 9-300 K. In addition to the emission band of Ti3+ in the near IR region and blue emission at 420 nm that are commonly observed in this material, we detected a UV band at 290 nm which contributes approximately one-third to the integrated emission under X-ray excitation. Based on the results of the study this band was assigned to the radiative decay of excitons localised at activator ions. Particular attention has been given to the assessment of the feasibility of the material as cryogenic scintillation detector. The low-temperature scintillation light yield of Al2O 3-Ti (0.20 wt%) is found to be 2300±200 ph/MeV at 32 keV and an estimate shows that it is two times larger for a sample with 0.07 wt% of activator. Given this, we concluded that Ti-doped Al2O3 appears to be very suitable material for cryogenic Dark Matter search experiments that rely on the simultaneous detection of phonon and scintillation signals. © 2005 Elsevier B.V. All rights reserved.
spellingShingle MIkhailik, V
Kraus, H
Balcerzyk, M
Czarnacki, W
Moszynski, M
Mykhaylyk, MS
Wahl, D
Low-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3
title Low-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3
title_full Low-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3
title_fullStr Low-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3
title_full_unstemmed Low-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3
title_short Low-temperature spectroscopic and scintillation characterisation of Ti-doped Al2O3
title_sort low temperature spectroscopic and scintillation characterisation of ti doped al2o3
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