Development of the (8)Li cross-relaxation technique: Applications in semiconductors and other condensed matter systems

The so-called "cross-relaxation" method is a powerful technique that can be used to provide detailed structural and site information on impurities in condensed matter systems, including semiconductors, In this paper, we report on the progress of its development at the new Li-8 P-detected n...

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מידע ביבליוגרפי
Main Authors: Mansour, A, Morris, G, Salman, Z, Chow, K, Dunlop, T, Jung, J, Fan, I, MacFarlane, W, Kiefl, R, Parolin, T, Saadaoui, H, Wang, D, Hossain, MD, Song, Q, Smadella, M, Mosendz, O, Kardasz, B, Heinrich, B
פורמט: Conference item
יצא לאור: 2007
תיאור
סיכום:The so-called "cross-relaxation" method is a powerful technique that can be used to provide detailed structural and site information on impurities in condensed matter systems, including semiconductors, In this paper, we report on the progress of its development at the new Li-8 P-detected nuclear magnetic resonance (beta-NMR) facility located in TRIUMF in Vancouver, Canada. We present first measurements using this method on a Cu single crystal and discuss future application for studies of isolated impurities in semiconductors. (C) 2007 Elsevier B.V. All rights reserved.