$Determining the C60 molecular arrangement in thin films by means of X-ray diffraction$

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledg...

Full description

Bibliographic Details
Main Authors:	Elschner, C, Levin, A, Wilde, L, Grenzer, J, Schroer, C, Leo, K, Riede, M
Format:	Journal article
Language:	English
Published:	International Union of Crystallography 2011

Similar Items

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
by: Schäfer, N, et al.
Published: (2016)

X-ray diffraction study of evaporated cadmium telluride thin films
by: Ismail, Bakar, et al.
Published: (2009)

X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects
by: Olivier Thomas, et al.
Published: (2022-04-01)

X- ray diffraction and dielectric properties of PbSe thin films
by: Bushra A. Hasan
Published: (2019-01-01)

Molecular ordering and charge transport in a dicyanovinyl-substituted quaterthiophene thin film
by: Elschner, C, et al.
Published: (2013)

Study of the Layer-Type BST Thin Film with X-ray Diffraction and X-ray Photoelectron Spectroscopy
by: Agata Lisińska-Czekaj, et al.
Published: (2022-01-01)

X-ray diffraction studies on silicon nanostructure thin films : (review paper) /
by: 445636 Yussof Wahab, et al.
Published: (2005)

X-Ray Diffraction Line Profile Analysis of Strongly Textured Thin Films of ZnO
by: P. Sutta, et al.
Published: (2003-06-01)

Effect of indium content on X- ray diffraction and optical constants of InxSe1-x thin films
by: Bushra A. Hasan
Published: (2019-02-01)

Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction
by: Kien Nguyen, et al.
Published: (2021-08-01)

Zinc phthalocyanine - Influence of substrate temperature, film thickness, and kind of substrate on the morphology
by: Schünemann, C, et al.
Published: (2011)

X-Ray diffraction.

X-ray diffraction/
by: Azaroff, Leonid V.
Published: (1974)

X-ray diffraction /
by: 205966 Warren, B. E.
Published: (1969)

Ultrafast x-ray diffraction
by: Sokolowski-Tinten, K, et al.
Published: (2005)

X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method
by: Tiankun, Wang, et al.
Published: (2020)

X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method
by: Tiankun, Wang, et al.
Published: (2020)

X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature.
by: Talib, Zainal Abidin, et al.
Published: (2010)

Study by X-ray diffraction of the residual stress produced during deposition of TiN thin films on metallic substrates
by: Mónica Monsalve, et al.
Published: (2010-01-01)

Direct feature extraction from two-dimensional X-ray diffraction images of semiconductor thin films for fabrication analysis
by: Akihiro Yamashita, et al.
Published: (2022-12-01)

Thin film analysis by x-ray scattering /
by: 195147 Birkholz, Mario, et al.
Published: (2006)

X-ray markers for thin film implants
by: Woodington, BJ, et al.
Published: (2021)

SUBPICOSECOND X-RAY-DIFFRACTION
by: Wark, J, et al.
Published: (1994)

X-ray diffraction by polymers/
by: 231135 Masao Kakudo, et al.
Published: (1972)

X-ray diffraction method/
by: 231171 Nuffield, E. W.
Published: (1966)

X-ray diffraction topography /
by: Tanner, B. K. (Brian Keith)
Published: (1976)

Elements of x-ray diffraction /
by: 464330 Cullity, B. D., et al.
Published: (2001)

X-ray diffraction tables /
by: 369710 Fang, Jen-Ho
Published: (1966)

Elements of x-ray diffraction /
by: 386239 Cullity, Bernard Dennis
Published: (1978)

Diffraction X-ray optics /
by: 330455 Erko, A. I., et al.
Published: (1996)

Elements of X-ray diffraction/
by: 386239 Cullity, Bernard Dennis
Published: (1956)

X-ray diffraction analysis /
by: 446663 Rudman, Reuben, et al.
Published: (1967)

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for do evaluation
by: Baimpas, N, et al.
Published: (2013)

'Ultrafast' extended to X-rays: Femtosecond time-resolved X-ray diffraction
by: von der Linde, D, et al.
Published: (2001)

Ultrafast time-resolved X-ray diffraction
by: Sokolowski-Tinten, K, et al.
Published: (2002)

Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction
by: Zhang, K, et al.
Published: (2011)

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d(o) evaluation
by: Baimpas, N, et al.
Published: (2013)

Investigation of HfO2 Thin Films on Si by X-ray Photoelectron Spectroscopy, Rutherford Backscattering, Grazing Incidence X-ray Diffraction and Variable Angle Spectroscopic Ellipsometry
by: Xuguang Luo, et al.
Published: (2018-06-01)

SUBNANOSECOND X-RAY-POWDER DIFFRACTION
by: Woolsey, N, et al.
Published: (1990)

Two-dimensional x-ray diffraction /
by: He, Bob B., 1954-
Published: (2009)