$Determining the C60 molecular arrangement in thin films by means of X-ray diffraction$

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledg...

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Bibliographic Details
Main Authors:	Elschner, C, Levin, A, Wilde, L, Grenzer, J, Schroer, C, Leo, K, Riede, M
Format:	Journal article
Language:	English
Published:	International Union of Crystallography 2011

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