An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam

An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam

A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-spec...

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গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক: Halpin, J, Webster, R, Gardner, H, Moody, M, Bagot, P, MacLaren, D
বিন্যাস: Journal article
প্রকাশিত: Elsevier 2019
বিবরন
সংক্ষিপ্ত:A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-specific and produces needles with minimal ion-beam damage; electron microscopy indicated the needle's surface amorphised/oxidised region to be less than 2 nm thick. The resulting needles were routinely analysable by APT, confirming the expected microstructure and showing negligible Xe contamination.

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