An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam
A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-spec...
Auteurs principaux: | , , , , , |
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Format: | Journal article |
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Elsevier
2019
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_version_ | 1826265856966918144 |
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author | Halpin, J Webster, R Gardner, H Moody, M Bagot, P MacLaren, D |
author_facet | Halpin, J Webster, R Gardner, H Moody, M Bagot, P MacLaren, D |
author_sort | Halpin, J |
collection | OXFORD |
description | A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-specific and produces needles with minimal ion-beam damage; electron microscopy indicated the needle's surface amorphised/oxidised region to be less than 2 nm thick. The resulting needles were routinely analysable by APT, confirming the expected microstructure and showing negligible Xe contamination. |
first_indexed | 2024-03-06T20:30:11Z |
format | Journal article |
id | oxford-uuid:30c652a1-9eb7-4ca1-9a6b-10b2716dec3d |
institution | University of Oxford |
last_indexed | 2024-03-06T20:30:11Z |
publishDate | 2019 |
publisher | Elsevier |
record_format | dspace |
spelling | oxford-uuid:30c652a1-9eb7-4ca1-9a6b-10b2716dec3d2022-03-26T13:03:43ZAn in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beamJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:30c652a1-9eb7-4ca1-9a6b-10b2716dec3dSymplectic Elements at OxfordElsevier2019Halpin, JWebster, RGardner, HMoody, MBagot, PMacLaren, DA method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-specific and produces needles with minimal ion-beam damage; electron microscopy indicated the needle's surface amorphised/oxidised region to be less than 2 nm thick. The resulting needles were routinely analysable by APT, confirming the expected microstructure and showing negligible Xe contamination. |
spellingShingle | Halpin, J Webster, R Gardner, H Moody, M Bagot, P MacLaren, D An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam |
title | An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam |
title_full | An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam |
title_fullStr | An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam |
title_full_unstemmed | An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam |
title_short | An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam |
title_sort | in situ approach for preparing atom probe tomography specimens by xenon plasma focused ion beam |
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