GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON

Bibliographic Details
Main Authors: Decoteau, M, Wilshaw, P, Falster, R
Format: Conference item
Published: 1992
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author Decoteau, M
Wilshaw, P
Falster, R
author_facet Decoteau, M
Wilshaw, P
Falster, R
author_sort Decoteau, M
collection OXFORD
description
first_indexed 2024-03-06T20:33:53Z
format Conference item
id oxford-uuid:31f76f16-c062-40f0-9992-370f5cef9d8c
institution University of Oxford
last_indexed 2024-03-06T20:33:53Z
publishDate 1992
record_format dspace
spelling oxford-uuid:31f76f16-c062-40f0-9992-370f5cef9d8c2022-03-26T13:11:10ZGETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICONConference itemhttp://purl.org/coar/resource_type/c_5794uuid:31f76f16-c062-40f0-9992-370f5cef9d8cSymplectic Elements at Oxford1992Decoteau, MWilshaw, PFalster, R
spellingShingle Decoteau, M
Wilshaw, P
Falster, R
GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
title GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
title_full GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
title_fullStr GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
title_full_unstemmed GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
title_short GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON
title_sort gettering of copper and iron to extended surface defects in silicon
work_keys_str_mv AT decoteaum getteringofcopperandirontoextendedsurfacedefectsinsilicon
AT wilshawp getteringofcopperandirontoextendedsurfacedefectsinsilicon
AT falsterr getteringofcopperandirontoextendedsurfacedefectsinsilicon