Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
Ptychography is a scanning coherent diffraction imaging technique that provides high-resolution imaging and complete spatial information of the complex probe and object transmission function. The wavefront error caused by aberrated optics has previously been recovered using ptychography when a highl...
المؤلفون الرئيسيون: | Moxham, TEJ, Laundy, D, Dhamgaye, V, Fox, OJL, Sawhney, K, Korsunsky, AM |
---|---|
التنسيق: | Journal article |
اللغة: | English |
منشور في: |
American Institute of Physics
2021
|
مواد مشابهة
-
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
حسب: Moxham, TEJ, وآخرون
منشور في: (2020) -
Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychography
حسب: Moxham, TEJ, وآخرون
منشور في: (2022) -
The development of partially coherent X-ray beam ptychography and adaptable optics for the study of nanomaterials
حسب: Moxham, TEJ
منشور في: (2022) -
Alvarez varifocal X-ray lens
حسب: Vishal Dhamgaye, وآخرون
منشور في: (2023-07-01) -
Nanoscale correlative X-ray spectroscopy and ptychography of carious dental enamel
حسب: Besnard, C, وآخرون
منشور في: (2022)